Description
CsAP, or cesium ammonium hydrogen biphthalate, is an X-ray single crystal commonly used as a standard material for X-ray diffraction measurements. CsAP crystals have a relatively high density and a low absorption coefficient for X-rays, making them ideal for use as a reference material. They are also used in X-ray diffractometers as a calibration standard for obtaining accurate diffraction patterns of other materials. CsAP crystals are grown using the solution method, typically from a mixture of cesium chloride, ammonium biphthalate, and water.
Crystal | CsAP | |
Reflection surface 2d, nm | 2.568 (001) | |
Peak reflection coefficient Pc, % | Sik±, 0.712 nm | 20.0 |
Alk±, 0.834 nm | 17.0 | |
Mgk±, 0.989 nm | 8.0 | |
Nak±, 1.191 nm | 4.2 | |
Cul±, 1.336 nm | 6.3 | |
Fek±, 1.831 nm | 6.5 | |
Reflection integral coefficient, Rc x 105 rad | Sik±, 0.712 nm | 4.7 |
Alk±, 0.834 nm | 5.0 | |
Mgk±, 0.989 nm | 4.8 | |
Nak±, 1.191 nm | 5.7 | |
Cul±, 1.336 nm | 6.0 | |
Fek±, 1.831 nm | 10.0 |
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