Alkaline Metals Biphthalate X-Ray Single Crystals: CsAP

Description

CsAP, or cesium ammonium hydrogen biphthalate, is an X-ray single crystal commonly used as a standard material for X-ray diffraction measurements. CsAP crystals have a relatively high density and a low absorption coefficient for X-rays, making them ideal for use as a reference material. They are also used in X-ray diffractometers as a calibration standard for obtaining accurate diffraction patterns of other materials. CsAP crystals are grown using the solution method, typically from a mixture of cesium chloride, ammonium biphthalate, and water.

Specification

Crystal		CsAP
Reflection surface 2d, nm		2.568 (001)
Peak reflection coefficient Pc, %	Si_{k_±}, 0.712 nm	20.0
	Al_{k_±}, 0.834 nm	17.0
	Mg_{k_±}, 0.989 nm	8.0
	Na_{k_±}, 1.191 nm	4.2
	Cu_{l_±}, 1.336 nm	6.3
	Fe_{k_±}, 1.831 nm	6.5
Reflection integral coefficient, Rc x 10⁵ rad	Si_{k_±}, 0.712 nm	4.7
	Al_{k_±}, 0.834 nm	5.0
	Mg_{k_±}, 0.989 nm	4.8
	Na_{k_±}, 1.191 nm	5.7
	Cu_{l_±}, 1.336 nm	6.0
	Fe_{k_±}, 1.831 nm	10.0

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